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Microscopy lab providers by Microvisionlabs.com near me? A device manufacturer had a product that involved a few different boards with varying components. There were circumstances that caused the need for a change in manufacturers of one of the boards. Due to this change, the device production at this facility would be shut down until the boards from this new vendor were validated. The Quality Control department required that an inspection of the solder joints of some of the components on the board be analyzed in order to determine whether this new board manufacturer met their specifications. If the desired specifications were met and no issues were found during the inspection of the joints then production of the devices could resume.

The SEM was used to examine the crystal morphology, and the EDS spectrum showed primarily carbon and oxygen, with small amounts of nitrogen and phosphorous. This indicated an organic material as the primary component. Because the SEM-EDS analysis showed the material was primarily a carbon based organic crystalline material, a Fourier transform infrared spectroscopy (FTIR) examination was performed on the suspect material. This analysis provides necessary information about the functional groups of the organic material in order to identify the unknown organic.

Dust samples were analyzed using polarized light microscopy (PLM) to provide percentages of the particle types present in the samples. MVL was able to determine that there was significant loading of glass fibers in the dust samples with the likely source being contractor’s work in the attic which involved disturbing the fiberglass insulation. The image on the right shows a few distinct glass fibers with a binder material adhered to them, consistent with fiberglass insulation.

MicroVision Labs is owned and operated by a career microscopist, John Knowles, who understands the needs of our clients. Our emphasis on helping our clients solve problems, not just providing data, sets us apart from other labs. We have the technology and knowledge to find answers to your most difficult challenges, helping you succeed at every step. Can I come in to see my samples analyzed? Yes, our clients are always welcome to come in while their samples are being analyzed. For much of the work we do, it is mutually beneficial for our clients to be present to help direct their project since they can provide expertise about their samples. Some of the services we provide such as polished cross sections have time consuming steps making it impractical for a client to stay to watch everything. In those cases it is recommended that you come in initially to explain what you need done and come back at a later time to see the finished product. Read extra details on Microvision labs services.

Do you give lab tours? Yes, we routinely give lab tours to our clients and potential clients. Please call and we would be happy to schedule a tour for you and your co-workers. Do you have other locations around the country? We do work for companies all across the United States, with one laboratory which is located in Chelmsford, Massachusetts. Did MicroVision Labs ever operate under a different company name? No, we have always been MicroVision Laboratories, Inc. Our founder, John Knowles, used to work for another laboratory that underwent several name changes (Eastern Analytical Laboratories, Industrial Environmental Analysts, American Environmental Network, Severn Trent Laboratories, and EMLab P&K Billeria) and was located nearby in Billerica. When that laboratory was closed in 2008, John hired a few of the remaining analysts and acquired its equipment, client list and phone number.

Using light microscopes to examine the optical and structural properties of samples is one of the oldest and most useful analytical techniques. MicroVision Labs has several high magnification microscopes, including a powerful Zeiss Axiotech microscope capable of 1800x optical magnification, with additional digital magnification, allowing for visualization of sub-micron structures. PLM allows for the identification of a wide range of particles through the examination of the internal birefringence, or variation in optical indices, within a sample. See additional details on this website.